Compositional Mapping by Z-Contrast Imaging
نویسندگان
چکیده
منابع مشابه
Compositional Mapping by EPMA and μXRF
We present methods combining backscattered-electron (BSE) mosaic imaging, quantitative spot-mode electron-probe microanalysis (EPMA), and quantitative compositional mapping by EPMA and micro-xray fluorescence (μXRF) to provide a framework for detailed analysis of terrestrial and lunar samples. BSE imaging provides a base map for the characterization of samples by EPMA. Recent developments in im...
متن کاملCompositional Verification for Object-Z
This paper presents a framework for compositional verification of Object-Z specifications. Its key feature is a proof rule based on decomposition of hierarchical Object-Z models. For each component in the hierarchy local properties are proven in a single proof step. However, we do not consider components in isolation. Instead, components are envisaged in the context of the referencing super-com...
متن کاملMulti-contrast Optical Coherence Tomography for Brain Imaging and Mapping
..................................................................................................................................... i Acknowledgements ................................................................................................................... ii Table of
متن کاملPupil Mapping in 2-D for High-Contrast Imaging
Pupil-mapping is a technique whereby a uniformly-illuminated input pupil, such as from starlight, can be mapped into a non-uniformly illuminated exit pupil, such that the image formed from this pupil will have suppressed sidelobes, many orders of magnitude weaker than classical Airy ring intensities. Pupil mapping is therefore a candidate technique for coronagraphic imaging of extrasolar planet...
متن کاملCompositional mapping of semiconductor structures by friction force microscopy
Topographic and chemical mapping of materials at high resolution define the goals of a microscope. Force microscopy can provide methods for simultaneous topography and chemical characterization of materials. Here we describe the use of the atomic force microscope to map chemical variations of semiconductor samples. Chemical maps of semiconductor InP/InGaAs alloys have been determined with 3 nm ...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Microscopy and Microanalysis
سال: 2011
ISSN: 1431-9276,1435-8115
DOI: 10.1017/s1431927611009512